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摘要翻译：
通过对大电流(10E5安培/平方厘米）下薄膜表面原子分辨运动的STM成像和分析，首次证明了时间结构涨落与电子风力之间的直接关系。在脉动结构中，载流子与原子之间的动量转移量至少比自由扩散的原子大5～15倍（正负1σ范围）。表面电阻率的相应变化将对纳米级电子性质产生显著的涨落特征。
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英文标题：
《Biased Structural Fluctuations due to Electron Wind Force》
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作者：
O. Bondarchuk, W.G. Cullen, M. Degawa and Ellen D. Williams
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最新提交年份：
2007
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分类信息：
一级分类：Physics 物理学
二级分类：Materials Science 材料科学
分类描述：Techniques, synthesis, characterization, structure. Structural phase transitions, mechanical properties, phonons. Defects, adsorbates, interfaces
技术，合成，表征，结构。结构相变，力学性质，声子。缺陷，吸附质，界面
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一级分类：Physics 物理学
二级分类：Statistical Mechanics 统计力学
分类描述：Phase transitions, thermodynamics, field theory, non-equilibrium phenomena, renormalization group and scaling, integrable models, turbulence
相变，热力学，场论，非平衡现象，重整化群和标度，可积模型，湍流
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英文摘要：
Direct correlation between temporal structural fluctuations and electron wind force is demonstrated, for the first time, by STM imaging and analysis of atomically-resolved motion on a thin film surface under large applied current (10e5 Amp/sqare cm). The magnitude of the momentum transfer between current carriers and atoms in the fluctuating structure is at least five to fifteen times (plus or minus one sigma range) larger than for freely diffusing adatoms. The corresponding changes in surface resistivity will contribute significant fluctuation signature to nanoscale electronic properties.
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PDF链接：
https://arxiv.org/pdf/704.1852
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