1
Title:Measuring production yield for processes with multiple quality characteristics
Source:International Journal of Production Research
Volume 44, Issue 21, 2006, Pages 4649 - 4661
Authors: W. L. Pearna; F. K. Wangb; C. H. Yena
DOI: 10.1080/00207540600589119
Link:http://www.informaworld.com/smpp ... ~content=a758025447
2
Title:Estimating process yield based on Spk for multiple samples
Source:International Journal of Production Research
Volume 45, Issue 1, 2007, Pages 49 - 64
Authors: W. L. Pearna; YA Ching Chenga
DOI: 10.1080/00207540600600122
Link:http://www.informaworld.com/smpp ... 9247086~frm=abslink