3、【作者(必填)】 Grigg, C. ; Electr. & Comput. Eng., Rose-Hulman Inst. of Technol., Terre Haute, IN ; Wong, P. ; Albrecht, P. ; Allan, R.
[url=]more authors[/url]
【文题(必填)】
The IEEE Reliability Test System-1996. A report prepared by the Reliability Test System Task Force of the Application of Probability Methods Subcommittee
【年份(必填)】
1999
【全文链接或数据库名称(选填)】 http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=780914
4、【作者(必填)】
Zhang, B. ; EECS Department, University of California, Berkeley, ; Tse, D.
The IEEE Reliability Test System-1996. A report prepared by the Reliability Test System Task Force of the Application of Probability Methods Subcommittee