ICCV：LoOp Looking for Optimal Hard Negative Embeddings for Deep Metric Learning

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LoOp: Looking for Optimal Hard Negative
                Embeddings for Deep Metric Learning
Bhavya Vasudeva1 * Puneesh Deora1 * Saumik Bhattacharya2 Umapada Pal1 Sukalpa Chanda3
  1
   Indian Statistical Institute, Kolkata, India 2 Indian Institute of Technology, Kharagpur, India
                3
                 stfold University College, Halden, Norway

             Abstract
  Deep metric learning has been effectively used to learn
distance metrics for different visual tasks like image re-
...

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关键词：embeddings Embedding Learning negative looking