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【无人驾驶，自动驾驶，无人机】AEC Q100,101,102,104,JESD,汽车电子要求
随着「AI人工智能」与「ADAS无人驾驶」应用已成为当今科技产业的新宠，欲转型进入高端汽车、无人机的电子组件供应链，就必须要从电子产品的高安全、高可靠性下功夫，随着相应的标准的出台，让我们这些靠电子“烧友”养活的从事者，也忙得“不矣乐乎”！新的知识更新换代之快，你还能Hold住吗？
在这里分享我们公司最近开展的相关可靠性设计、生产控制、测试验证学习培训的资料及所涉及相关国际标准，作者整理在此，目的是让同行们了解，高安全性、高可靠性的方向在哪里？用什么做参照？Benchmark是什么？衡量的基准是什么？未经作者同意，不得转载！欢迎共同学习进步！作者QQ：2725848194
1.车用多芯片组件AEC-Q104规范解读.docx
2.高端电子产品可靠性加速实验测试、分析、预测培训pptx
Accelerated Testing of Advanced ElectronicsPart-2.pdf
AEC Q100 培训资料2018.pptx
AEC-Q100：2007Failure Mechanism Based Stress Test Qualification for Integrated Circuits.pdf
AEC-Q101：2013Failure Mechanism Based Stress Test Qualification for Discrete Semiconductorsin Automotive Applications.pdf
AEC-Q102：2017Failure Mechanism Based Stress Test Qualification for Discrete OptoelectronicSemiconductors in Automotive Applications.pdf
AEC-Q104：2017Failure Mechanism Based Stress Test Qualification for Multichip Modules.pdf
AEC-Q104++.pdf
AEC-Q200：被动组件2010.pdf
Board Level Reliability Primer for EmbeddedProcessors.pdf
Fundamentals of AEC-Q100-6：2018.pdf
IPC-9701 Solder Joint Reliability Based onThermal Fatigue.pdf
IPC-9701：2002表面安装锡焊件性能试验方法与鉴定要求-EN.pdf
IPC-9701A培训.pdf
IPC-9701A 实操、应用培训.pptx
IPC-9701A.pdf
1> JESD 47H-2012Stress-Test-Driven Qualification of Integrated Circuits.pdf
2> JESD22 A111A2010EvaluationProcedure for Determining.pdf
3> JESD22 B112A2009 PackageWarpage Measurement of Surface-Mount Integrated Circuits at ElevatedTemperature-高温翘曲.pdf
4> JESD22 B113A 2012 Board LevelCyclic Bend Test Method for Interconnect Reliability Characterization of SMTICs.pdf
5> JESD22 B114A 2011 MarkLegibility标志易读性，pdf
6> JESD22-A102D 2010 AcceleratedMoisture Resistance-Unbiased.pdf
7> JESD22-A103D 2010 High Temperature StorageLife高温储存.pdf
8> JESD22-A108D 2010 Temperature，Bias，and Operating Life.pdf
9> JESD22-A110D 2010 Highly AcceleratedTemperature and Humidity stress.pdf
10> JESD22-A115B-2010Electrostatic Discharge（ESD）SensitivityTesting.（MM）.pdf
11> JESD22-A117C 2011Electrically Erasable Programmable.pdf
12> JESD22-A118A 2011 AcceleratedMoisture Resistance-Unbiased HAST.pdf
13> JESD22-B101B-2009 ExternalVisual.rar
14> JESD22-B105D 2011 Lead Integrity 引线强度.pdf
15> JESD22-B107D 2011 Mark Permanency标志耐久性.，pdf
16> JESD22-B108B 2010 CoplanarityTest for Surface-Mount Semiconductor Devices共面性.pdf
17> JESD22-B115A 2010 Solder BallPu焊球拉力.pdf
18> JESD22-B116A-2009 Wire Bond Shear Test Method.rar
19> JESD22-B118 2011 Semiconductor Wafer and Die Backside ExternalVisual Inspection.pdf
20> JESD221 2011Alpha Radiation Measurement in Electronic Materials.pdf
21> MIL-STD-1580D 2003 Destructive physical analysis for electronic.pdf
22> Practical Application of AEC Requirements for AutomotiveComponents:2019.pdf
23> Practical Application of AEC Requirements for AutomotiveComponents:2019.pptx
24> Product package mechanical reliability test.pdf
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