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Venkatarama Krishnan, "Probability and Random Processes (Wiley Survival Guides in [size=13.4333px]Engineering and Science)"
Publisher: Wiley-Interscience | ISBN:0471703540 | PDF | 8.9 MB
A resource for probability AND random processes, with hundreds of worked examples and probability and Fourier transform tables
This survival guide in probability and randomprocesses eliminates the need to pore through several resources to finda certain formula or table. It offers a compendium of most distributionfunctions used by communication engineers, queuing theory specialists, [size=13.4333px]signal processing engineers, [size=13.4333px]biomedical engineers, physicists, and students.
Key topics covered include:
Random variables and most of their frequently used discrete and continuous [size=13.4333px]probability distribution functions
Moments, transformations, and convergences of random variables
Characteristic, generating, and moment-generating functions
Computer generation of random variates
Estimation theory and the associated orthogonality principle
Linear vector spaces and matrix theory with vector and matrix differentiation concepts
Vector random variables
Random processes and stationarity concepts
Extensive classification of random processes
Random processes through linear systems and the associated Wiener and Kalman filters
Application of probability in single [size=13.4333px]photon emission tomography (SPECT)
More than 400 figures drawn to scale assist readers in understandingand applying theory. Many of these figures accompany the more than 300examples given to help readers visualize how to solve the problem athand. In many instances, worked examples are solved with more than oneapproach to illustrate how different probability methodologies can workfor the same problem.
Several probability tables with accuracy up to nine decimal places areprovided in the appendices for quick reference. A special feature isthe graphical presentation of the commonly occurring Fouriertransforms, where both time and frequency functions are drawn to scale.
This book is of particular value to undergraduate and graduate studentsin electrical, computer, and civil engineering, as well as students inphysics and applied mathematics. Engineers, computer scientists,biostatisticians, and researchers in communications will also benefitfrom having a single resource to address most issues in probability andrandom processes.
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